[STUNNED] Ultrafast, High-resolution, X-ray Microscopy for Nanometrology: Single-shot Hyperspectral Ptychography in a Compact and Cost-effective Device
Ente: European Commission
Scadenza: 2027-08-31
Importo max: 150.000 EUR
Paese: EU
Descrizione
The inspection market is valued USD 15 billion in 2025 and it is projected to double by 2030, encompassing industrial segments across energy, healthcare, semiconductors, optoelectronics, aerospace. Common to all is the need of a high variety of image products in a short time frame, with high spatial resolution and sensitivity, which drives the demand for new nanometrology devices for quality control, supply chain certification, and regulatory compliance. A powerful opportunity is represented by X-ray ptychography, a computational scanning microscopy technique that provides images with quantitative chemical composition and 2D/3D morphology sample information, plus intensity and wavefront of the illumination. Despite the disruptive potential, its widespread application in real-time and in operando inspection is hindered by a major limitation: the scanning requirement.
STUNNED will tackle this challenge, bringing soft X-ray single-shot hyperspectral ptychography from a proof-of-concept to a successfully operating device with marketable potential. This project leverages the technology developed in ULTRAIMAGE, where ultrafast, multiscale, imaging with Ångstrom-to-nanometer spatial resolution was scaled to a compact system capable of working with any soft X-ray light source. Here, the technology will be made available for the first time in a scanning-free, multi-wavelength, cost-effective device ready to be deployed in any inspection process, fostering unprecedented nanometrology precision and broadening its accessibility to a larger stakeholders and end users audience. Key to STUNNED is the strategic consortium of collaborators involved, supporting system design, X-ray high quality optics and fast detection provision, knowledge transfer and go-to-market strategy. STUNNED will mark a paradigm shift from trial-and-error towards predictive fabrication methods across production segments, with societally relevant ramifications in resources optimization and sustainability.
Settori: coherent diffractive imaging, single-shot, inspection
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